Atomic Force Microscopy

Park XE7 Atomic Force Microscopy provides accurate measurement at the highest nanoscale resolution than any other products in its class. It allows to obtain sample images to the nano structure because of its linear scan measurements. It is compact, user-friendly, and fast as compared to other AFMs available. Together with its intuitive graphical user interface, and its automated tools, allows even novice users to get from sample placement to scan results, fast.

Key Features:

1. Pre-aligned tip mount
2. Easy sample and tip exchange
3. Simple laser alignment
4. On-axis top-down optical viewing
5. User friendly scan controls and software processing
6. Economical beyond the system cost

Park XE7 offers you much longer product life and upgradeability because of its compatibility with the most extensive types of modes and options available in the industry.

Service 1: Atomic Force Microscopy (AFM)

We offer high-resolution Atomic Force Microscopy (AFM) measurements for a wide range of samples, including thin films, membranes, coatings, nanostructures, polymers, semiconductors, biomaterials, and other solid surfaces. AFM provides detailed three-dimensional surface topography, surface roughness, grain size, particle distribution, step height, and nanoscale morphological analysis.

Service 2: Magnetic force Microscopy (MFM)

We offer high-resolution Magnetic Force Microscopy (MFM) characterization for magnetic thin films, nanoparticles, nanowires, spintronic devices, magnetic storage media, and other magnetic materials. MFM provides non-destructive, nanoscale imaging of magnetic domain structures and stray magnetic fields, enabling detailed analysis of magnetic domains, domain walls, and magnetic interactions for advanced materials research and device development.

Sample Requirements: Samples submitted for AFM/MFM analysis must be clean, dry, mechanically stable, and prepared in accordance with standard sample preparation protocols. They should be securely mounted on a rigid substrate, free from loose particles, contamination, or adhesive residues. For MFM analysis, samples must not be strong permanent magnets.