Atomic Force Microscopy

Atomic Force Microscopy

Park XE7 Atomic Force Microscopy provides accurate measurement at the highest nanoscale resolution than any other products in its class. It allows to obtain sample images to the nano structure because of its linear scan measurements. It is compact, user-friendly, and fast as compared to other AFMs available. Together with its intuitive graphical user interface, and its automated tools, allows even novice users to get from sample placement to scan results, fast.

Key Features:

1. Pre-aligned tip mount
2. Easy sample and tip exchange
3. Simple laser alignment
4. On-axis top-down optical viewing
5. User friendly scan controls and software processing
6. Economical beyond the system cost

Park XE7 offers you much longer product life and upgradeability because of its compatibility with the most extensive types of modes and options available in the industry.


Bilal Razzak