Central Lab at LUMS
BET-Surface Area Analyzer
Quantachrome Nova 200E
| Sr# | Type of Analysis | Rates for Academia (Rs. per sample) | Rates for Industry (Rs. per sample) |
| 1. | Surface Area only | 2500 | 5000 |
| 2. | Pore size and volume distribution | 5000 | 8500 |
Scanning Electron Microscopy (SEM) Including EDX
| Sr# | Type of Analysis | Rates for Academia (Rs. per sample) | Rates for Industry (Rs. per sample) |
| 1. | SEM using built-in ETD and TLD detector | 4000 | 5500 |
| 2. | EDX Analysis (line/area scan, elemental map)* | 2000 | 3000 |
X-Ray Diffraction (XRD) for Powder / Thin Film
Rigaku SmartLab SE, Japan
| 2θ Range | Rates for Academia (Rs. per sample) | Rates for Industry (Rs. per sample) | Technical Details | Applications |
| 10° to 80° | 6000 | 12000 | Standard range, covers most key reflections. | Phase identification, lattice parameter calculations, bulk analysis. |
| 80° to 160° | 6000 | 12000 | Extended high-angle range, studying small interplanar spacings (d). | High-resolution structural studies, advanced materials, complex lattices. |
| 10° to 160° | 12000 | 24000 | Comprehensive range for complete material characterization | Thin films, multilayers, bulk samples, and high-precision studies. |
| Powder = The quantity (volume) required for Powder Samples = 80mm3 to 200mm3 Thin Film = It must have a plane surface. | ||||
X-Ray Reflectivity Measurements (XRR) of Thin Film
Rigaku SmartLab SE, Japan
| 2θ Range | Rates for Academia (Rs. per sample) | Rates for Industry (Rs. per sample) | Technical Details | Applications |
| 10° to 80° | 2000 | 4000 | Visit the website for the "Key XRR Parameters Required for Measurement and Data Analysis" | XRR measurements and analyses for single or multilayer thin films, delivering precise data on thickness, density, and surface/interface roughness with high accuracy. |
Physical Properties Measurement System
Vibrating Sample Magnetometry (VSM)
| Options | Type of Analysis | Rates for Academia (Rs. per sample) | Rates for Industry (Rs. per sample) |
| 1. | ZFC Temperature Scan (5k – 300K) | 20000 | 40000 |
| 2. | FC Temperature Scan (300K – 5k) | 20000 | 40000 |
| 3. | Low temperature hysteresis (0 to ±5T) | 10000 | 20000 |
| 4. | Room temperature hysteresis (0 to ±5T) | 5000 | 10000 |
X-Ray Diffraction (XRD)
Bruker D2 Phaser
| Options | Type of Analysis | Rates for Academia (Rs. per sample) | Rates for Industry (Rs. per sample) |
| 1. | XRD (2q range 20°-60°) | 4000 | 5500 |
| 2. | XRD (2q range 10°-80°) | 5000 | 7500 |
Zetasizer (Malvern Nano ZSP)
| Options | Type of Analysis | Rates for Academia (Rs. per sample) | Rates for Industry (Rs. per sample) |
| 1. | Measurement of zeta size | 2000 | 3000 |
| 2. | Measurement of zeta potential | 2000 | 3000 |
| 3. | Measurement of both zeta size and potential of the same sample | 3500 | 4500 |
While submitting the sample, please mention the solvent in which the nanoparticles are dispersible.