X-Ray Diffraction (Rigaku)

SmartLab SE: Multipurpose High-Precision X-ray Diffraction System

The Rigaku SmartLab SE is a versatile X-ray diffractometer optimized for powder and thin film analyses, offering advanced features and applications. For powder analysis, it excels in phase identification, structural analysis, and lattice parameter determination, making it ideal for studying metals, alloys, ceramics, oxides, semiconductors, polymers, pharmaceuticals, minerals, geological samples. For thin films, the Diffractometer provides precise characterization of thickness, density, and surface roughness through X-ray reflectivity (XRR). It offers advanced capabilities, including high-resolution X-ray diffraction (HRXRD), reciprocal space mapping, and texture analysis, providing detailed insights into crystal quality, microstructure, and strain. Furthermore, it supports rocking curve analysis to evaluate crystal perfection and mosaicity, and Rietveld analysis for precise phase quantification, lattice parameter refinement, and structural modeling, making it a versatile tool for comprehensive material characterization. With automated alignment, high-resolution optics, and comprehensive software, the SmartLab SE delivers accurate and reliable results, making it an indispensable tool for researchers and industries focusing on advanced materials characterization.

Service 1: X-Ray Diffraction (XRD) Measurements for Powder and Thin Films

We offer X-Ray Diffraction (XRD) measurements for powder and thin film samples, providing crucial insights into crystal structure, phase identification, and lattice parameters for material development and quality control.
 

Service 2: X-Ray Reflectivity (XRR) Measurement and Advanced Analysis of Thin Film (All about XRR)

We offer X-ray Reflectivity (XRR) measurements along with analyses for single or multilayer thin films, delivering precise data on thickness, density, and surface/interface roughness with high accuracy for advanced material characterization in research and industry. Film Thickness Ranges from a few nanometers to 1000 nm. It is mandatory to provide the parameters before submitting for XRR, for details see the link below.

Key XRR Parameters Required for Measurement and Data Analysis